@ARTICLE{10016237,
  author={Nguyen, Kevin P. and Treacher, Alex H. and Montillo, Albert A.},
  journal={IEEE Transactions on Pattern Analysis and Machine Intelligence}, 
  title={Adversarially-Regularized Mixed Effects Deep Learning (ARMED) Models Improve Interpretability, Performance, and Generalization on Clustered (non-iid) Data}, 
  year={2023},
  volume={45},
  number={7},
  pages={8081-8093},
  doi={10.1109/TPAMI.2023.3234291}}